[ovs-dev] [PATCH] tests/classifier: Make test work in big-endian systems.
Ben Pfaff
blp at nicira.com
Fri Dec 5 18:24:03 UTC 2014
On Wed, Dec 03, 2014 at 01:21:48PM -0800, Jarno Rajahalme wrote:
> Change a test so that the result will be the same in both
> little-endian and big-endian systems.
...by editing the test case so that only one bit differs?
> Reported-by: Mijo Safradin <mijo at linux.vnet.ibm.com>
> Signed-off-by: Jarno Rajahalme <jrajahalme at nicira.com>
Acked-by: Ben Pfaff <blp at nicira.com>
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