[ovs-dev] [PATCH] tests/classifier: Make test work in big-endian systems.

Ben Pfaff blp at nicira.com
Fri Dec 5 18:24:03 UTC 2014


On Wed, Dec 03, 2014 at 01:21:48PM -0800, Jarno Rajahalme wrote:
> Change a test so that the result will be the same in both
> little-endian and big-endian systems.

...by editing the test case so that only one bit differs?

> Reported-by: Mijo Safradin <mijo at linux.vnet.ibm.com>
> Signed-off-by: Jarno Rajahalme <jrajahalme at nicira.com>

Acked-by: Ben Pfaff <blp at nicira.com>



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